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Homenda, Wladyslaw; Luckner, Marcin

Pattern recognition with rejection: Application to handwritten digits Inproceedings

2014 4th World Congress on Information and Communication Technologies (WICT 2014), pp. 326–331, IEEE, 2014, ISBN: 978-1-4799-8115-1.

Abstract | Links | BibTeX | Tags: Accuracy, Classification with rejection, Handwriting recognition, native and foreign elements, pattern recognition with rejection, Standards, Support Vector Machines, Testing, Text recognition


Luckner, Marcin; Szyszko, Krzysztof

RBF ensemble based on reduction of DAG structure Inproceedings

Proceedings of the 2013 Federated Conference on Computer Science and Information Systems, pp. 99–105, IEEE, Kraków, 2013.

Abstract | Links | BibTeX | Tags: Accuracy, binary classifiers, Chebyshev approximation, classes similarity, Classification, classification cost reduction, DAG structure reduction, Directed Acyclic Graph, directed graphs, Euclidean distance, Glass, Kernel, learning (artificial intelligence), pattern classification, Radial Basis Function, radial basis function ensemble, radial basis function networks, RBF ensemble, recognition accuracy, Support Vector Machines, UCI repository