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Homenda, Wladyslaw; Luckner, Marcin

Pattern recognition with rejection: Application to handwritten digits Inproceedings

2014 4th World Congress on Information and Communication Technologies (WICT 2014), pp. 326–331, IEEE, 2014, ISBN: 978-1-4799-8115-1.

Abstract | Links | BibTeX | Tags: Accuracy, Classification with rejection, Handwriting recognition, native and foreign elements, pattern recognition with rejection, Standards, Support Vector Machines, Testing, Text recognition


Luckner, Marcin

Recognition of Noised Patterns Using Non-Disruption Learning Set Inproceedings

Sixth International Conference on Intelligent Systems Design and Applications, pp. 557–562, IEEE, 2006, ISBN: 0-7695-2528-8.

Abstract | Links | BibTeX | Tags: Computer networks, Delay, Geodesy, music symbols, Noise generators, noised pattern recognition, nondisruption learning set, nondisruption patterns, optical character recognition, Optical character recognition software, optical music recognition, Optical noise, Ordinary magnetoresistance, Pattern recognition, Probes, recognition system, strongly noised symbol recognition, supervised recognition, Testing, unsupervised recognition